The Nova NanoSEM™ is a high resolution scanning electron microscope intended for sample characterization. In addition to the SEM features, the Nova system is configured with a beam blanker and the Raith ELPHY Quantum software to enable electron beam lithography for users who do not require the ultra-high resolution of the Elionix system.
Contact the CUNY Advanced Science Research Center NanoFabrication Facility at email@example.com with inquiries. Potential new users can visit http://nanofab.asrc.cuny.edu/become-a-member/ for instructions on becoming a qualified user.
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To gain access you must be a member of CUNY ASRC NanoFabrication Facility, a member of a group partnered with this group, or affiliated with the resource owner.